Attribute sampling plans, tables of tests, and confidence limits for proportions /

Attribute sampling plans, tables of tests, and confidence limits for proportions /

Bibliographic Details
Main Author:	Odeh, Robert E
Other Authors:	Owen, D. B (Donald Bruce), 1922-
Format:	Book
Language:	English
Published:	New York : M. Dekker, [1983], ©1983 New York : c1983 New York : c1983
Series:	Statistics, textbooks and monographs ; v. 49 Statistics, textbooks and monographs v. 49 Statistics, textbooks and monographs ; v. 49 Statistics, textbooks and monographs v. 49
Subjects:	Quality control > Tables Sampling (Statistics) > Tables Quality control Sampling (Statistics) Tables (Data) Tables

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Stanford University

Holdings details from Stanford University
Call Number:	TS156 .O25 1983

Yale University

Holdings details from Yale University
Call Number:	TS156 O25 1983 (LC)

University of Chicago

Holdings details from University of Chicago
Call Number:	TS156.O250 1983

Duke University

Holdings details from Duke University
Call Number:	658.562 O23, A885, 1983

Cornell University

Holdings details from Cornell University
Call Number:	+ TS156 .O23

Columbia University

Holdings details from Columbia University
Call Number:	TS156 .O25 1983