Estimation of uncertainty in application profiles /

Bibliographic Details
Main Author: Flater, David (Author)
Corporate Author: Physical Measurement Laboratory (National Institute of Standards and Technology (U.S.))
Format: Government Document Book
Language:English
Published: Gaithersburg, MD : U.S. Dept. of Commerce, National Institute of Standards and Technology, 2014
Series:NIST technical note ; 1826
NIST technical note 1826
Subjects:

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Stanford University

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