International Workshop on Statistical Metrology

International Workshop on Statistical Metrology

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Bibliographic Details
Corporate Authors: International Workshop on Statistical Metrology, IEEE Electron Devices Society, Institute of Electrical and Electronics Engineers, Ōyō Butsuri Gakkai
Format: Conference Proceeding
Language:English
Published: Piscataway, NJ : IEEE,
Subjects:
Semiconductors > Characterization > Statistical methods > Congresses
Semiconductors > Measurement > Statistical methods > Congresses

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Stanford University

Holdings details from Stanford University
Call Number: TK7871.85 .I5837 2ND 1997
TK7871.85 .I5837 3RD 1998
TK7871.85 .I5837 4TH 1999
TK7871.85 .I5837 5TH 2000

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