High speed thin plate fatigue crack monitor /

High speed thin plate fatigue crack monitor /

Bibliographic Details
Corporate Author: United States National Aeronautics and Space Administration
Other Authors: Wincheski, Buzz A
Format: Government Document Book
Language:English
Published: [Washington, DC] : [National Aeronautics and Space Administration], [1992]
Edition:[Redacted edition]
Series:NASA case ; LAR-14816-1-SB
Subjects:
Fractography
Metals > Fatigue
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