Lifetime spectroscopy : a method of defect characterization in silicon for photovoltaic applications /
Annotation
| Main Author: | |
|---|---|
| Format: | Book |
| Language: | English |
| Published: |
Berlin ; New York :
Springer,
c2005
|
| Series: | Springer series in materials science ;
v. 85 |
| Subjects: |
| Summary: | Annotation |
|---|---|
| Physical Description: | 1 online resource (xxvi, 489 p.) : ill. (some col.) |
| Bibliography: | Includes bibliographical references and index |
| ISBN: | 3540279229 9783540279228 |
| ISSN: | 0933-033X ; |